Absolute maximum ratings

Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device.¹

Table 1. Absolute maximum ratings
	Note	Min.	Max.	Unit
Supply voltages
VDD		-0.3	+3.9	V
VDDH		-0.3	+5.8	V
VBUS		-0.3	+5.8	V
VSS			0	V
I/O pin voltage
V_I/O, VDD ≤3.6 V		-0.3	VDD + 0.3	V
V_I/O, VDD >3.6 V		-0.3	3.9	V
NFC antenna pin current
I_NFC1/2			80	mA
Environmental aQFN73™ package
Storage temperature		-40	+125	°C
MSL	Moisture Sensitivity Level		2
ESD HBM	Human Body Model		4	kV
ESD HBM Class	Human Body Model Class		3A
ESD CDM	Charged Device Model		750	V
Environmental QFN40 package
Storage temperature		-40	+125	°C
MSL	Moisture Sensitivity Level		2
ESD HBM	Human Body Model		4	kV
ESD HBM Class	Human Body Model Class		3A
ESD CDM	Charged Device Model		1	kV
Environmental WLCSP 3.175 x 3.175 mm package
Storage temperature		-40	+125	°C
MSL	Moisture Sensitivity Level		1
ESD HBM	Human Body Model		4	kV
ESD HBM Class	Human Body Model Class		3A
ESD CDM	Charged Device Model		750	V
Flash memory
Endurance		10 000		write/erase cycles
Retention at 85 °C		10		years
Retention at 105 °C	Limited to 1000 write/erase cycles	3		years
Retention at 105 °C-85 °C, execution split	Limited to 1000 write/erase cycles 75% execution time at 85 °C or less	6.7		years

¹ For accelerated life time testing (HTOL, etc) supply voltage should not exceed the recommended operating conditions max value, see Recommended operating conditions.